SPM-30250 UV-VIS-NIR Spectrophotometer
300–2500 nm, double‑beam, broadband, high resolution
Typical application scenarios
SPM-30250 UV-VIS-NIR Spectrophotometer is a double‑beam UV‑Vis‑NIR spectrophotometer designed for material analysis, compliant with GB/T 39552.2‑2020, JJF1106, ISO 8980, and JJG 178. Featuring broadband coverage, high precision, and high stability, it is suitable for measuring characteristic absorption and spectral transmittance of coated lenses, photovoltaic glass, semiconductors, optical components, architectural glass, and advanced materials over 300–2500 nm. It enables automated analysis of transmission/absorption spectra, absorbance, transmittance, and UV/IR radiation hazard filtering rate.
Main characteristics
1.Double-beam design
Double-beam measurement ensures excellent stability, high repeatability, and improved accuracy.
2.High resolution
High wavelength accuracy with spectral bandwidth as narrow as 2.0 nm, delivering superior spectral resolution and analytical precision.
3.Broadband coverage
Wavelength range of 300–2500 nm enables continuous UV-VIS-NIR scanning, ideal for analysis of architectural glass, insulation materials, LiDAR, optical lenses, and more.
4.Intelligent software
User-friendly interface with good interactivity, providing analytical and computational functions for various industry parameters, with customizable and expandable software capabilities.
Technical Specifications
| Model | SPM-30250 |
| Wavelength range | 300 nm-2500 nm |
| Single/double beam | double beam |
| Transmission measurement geometry | 0/0和0/d |
| Reflection measurement geometry | 8/d |
| Minimum spectral bandwidth | 2 nm |
| Wavelength repeatability | Maximum 0.5 nm |
| Wavelength accuracy | Maximum 1.0 nm |
| Baseline flatness (absorbance) | Maximum ±0.002 |
| Absorbance range | 4.0A |
| Stray light | 0.2%(360 nm) |
| Transmission measurement accessories | Solid sheet sample holder |
| Reflection measurement accessories | 8/d integrating sphere; reflection measurement fixture |