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Home Products Mini/Micro LED Test CXC Series Micro Imaging Luminance Colorimeter
CXC Series Micro Imaging Luminance Colorimeter
High sensitivity and signal-to-noise ratio, excellent repeatability
Typical application scenarios
CXC µ Imaging Luminance colorimeter adopts XYZ filters to match CIE 1931 color-matching functions. It can realize 2D luminance and color measurements with high speed and high accuracy, so that it can be widely applied to measurement luminance, chromaticity coordinates, luminance/color uniformity and pixel-level image analysis for Mini LED and Micro LED.
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Main characteristics
Luminance, chromaticity and uniformity information of each pixel can be obtained by single sampling
A scientific-grade constant temperature cooling area array detector is used, and the spectral response of the detector highly matches the XYZ curve of the human eye. One measurement is equivalent to tens of millions of spot-type luminance meters working at the same time, which can quickly and accurately obtain the luminance and chromaticity of each point and analysis.
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Measurement of extremely low luminance and extremely high repeatability
Noise is an important factor that affects the measurement sensitivity, stability and repeatability, and the noise mainly comes from temperature of the detector. CXC-2120µ can achieve lower constant temperature cooling temperature, with professional low-noise circuit design, even at extremely low luminance, it can still ensure high measurement repeatability and stability.
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Wide linear dynamic range and high measurement accuracy
Not only does the scientific-grade area array detector itself have good linearity, this device also uses high linear dynamic range (HDR) technology, which can achieve less than 1% measurement linearity within 7 orders of magnitude.
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Advanced artificial intelligence algorithm to help realize various measurement and analysis
Compatible with various algorithms such as intelligent image recognition, CXCµ is suitable for various objects (such as special-shaped screens and curved screens), customize luminance and chromaticity uniformity analysis functions, and support display screen defect (MURA) evaluation.
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Highly reliable operation/communication over long distance via Gigabit Ethernet,even in the complex manufacturing environments.
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Technical Specifications
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