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Home News Company News Final Report of IC 2023 International Interlaboratory Comparison on Transient Light Modulation Released
Final Report of IC 2023 International Interlaboratory Comparison on Transient Light Modulation Released

EverfineRelease time:2026-07-14

In June 2026, the Solid-State Lighting and Smart Controls (SSLC) platform under the IEA 4E (International Energy Agency Efficient End-Use Equipment) released the Final Report of Interlaboratory Comparison on Transient Light Modulation (IC 2023), disclosing the final IC 2023 test results. The report’s foreword specially acknowledges contributions from Professor Pan Jiangen, Chairman of Hangzhou Everfine Photo-E-Info Co., Ltd., and the National Lighting Test Centre (NLTC, Beijing).

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In 2023, the IEA launched IC 2023, an international interlaboratory comparison for Transient Light Modulation (TLM) measurements of Solid-State Lighting (SSL) products, to verify measurement consistency of lighting flicker evaluation metrics across laboratories. To broaden the applicability of IC 2023, this global comparison was linked to two concurrent regional interlaboratory comparisons: the EMPIR MetTLM (Metrology for Transient Light Modulation) project under the European Metrology Programme for Innovation and Research, and China’s national standard verification programme GBV-LC TLM. NLTC (Beijing) and Hangzhou Everfine joined the core measurement comparison group.2.png


This newly released final report represents a four-year research outcome since the IEA 4E SSLC initiated the comparison in 2023. It consolidates TLM test data from 24 laboratories across 15 countries, to assess global measurement consistency of key TLM parameters for LED products, and serves as proficiency verification evidence for laboratory accreditation. IC 2023 focuses exclusively on TLM metrics, including short-term flicker indicator (PstLM), Stroboscopic Visibility Measure (SVM), modulation depth, flicker index and visual modulation.


Furthermore, the IC 2023 report elaborates core technical challenges in TLM measurement, such as power supply interference on PstLM testing, anti-aliasing filter impacts on SVM measurement, and optimised Mp calculation algorithms. This interlaboratory comparison will advance global research and international standardisation of TLM measurement.


Transient Light Modulation (TLM), commonly referred to as flicker, is a critical hazard to human eyes that must be addressed in LED lighting, with its measurement attracting worldwide attention. For over two decades, Everfine has specialised in TLM research and testing instrument development, holding a leading global position in relevant equipment. The Everfine Optoelectronics Research Institute chairs the CIE TLM technical committee (TC2-89), with Deputy Director Li Qian serving as the committee chairperson.



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